Within the demanding thermal management frameworks of high-performance computing (HPC) enterprise servers, high-power automotive power electronic switchgear, and advanced telecommunication RF front-ends, core semiconductors experience operational temperatures between 125°C and 150°C. Under these prolonged campaigns, thermal interface materials encounter a critical reliability hazard: “Thermal Hardening” coupled with bulk thermal conductivity degradation. Conventional high-performance pads systematically […]
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