Tag Archives: CCL Buffer Pad

Eliminating Thickness Tolerances in Composites: Hydrodynamic Pressure Equalization and Stress Relaxation of CCL Lamination Buffer Pads

ccl-laminator-silicone-buffer-pad-mechanics

During the aggressive high-temperature, high-pressure baking campaigns of Copper Clad Laminates (CCL) and multi-layer Rigid/Flex Printed Circuit Boards (PCBs), interface processing consumables encounter electronic manufacturing’s absolute manufacturing limits. Vacuum presses operate under severe thermomechanical parameters (200°C – 230°C, 4 – 6 MPa) to bond and cure copper foils, glass fabrics, and epoxy resins seamlessly. Under […]